| 摘要 |
Systems in which PCM is used, including memory systems, as well as methods for operating such systems. A test of PCM memory elements with known states can be used to determine whether immediately available voltage levels can reliably read PCM. This can be used to accelerate availability of memory states residing in PCM with respect to, for example, redundancy address storage, other startup state information, and parameters for which nonvolatile storage is useful. |
