发明名称 METHODS FOR TEXTURING A SEMICONDUCTOR MATERIAL
摘要 <p>A method for modifying the texture of a semiconductor material is provided. The method includes performing a first texture step comprising reactive ion etching to a first surface of semiconductor material. After the first texture step, the first surface of the semiconductor material has a random texture comprising a plurality of peaks and a plurality of valleys, and wherein at least fifty percent of the first surface has a peak-to-valley height of less than one micron and an average peak-to-peak distance of less than one micron. Additional texture steps comprising wet etch or RIE etching may be optionally applied.</p>
申请公布号 WO2013188218(A1) 申请公布日期 2013.12.19
申请号 WO2013US44622 申请日期 2013.06.07
申请人 GTAT CORPORATION 发明人 NEWMAN, BONNA;MURALI, VENKATESAN;LI, ZHIYONG;CHEN, LIANG
分类号 H01L21/3065;H01L31/0236;H01L31/042 主分类号 H01L21/3065
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