发明名称 SUBSTRATE HAVING ETCHING MASK AND METHOD FOR PRODUCING SAME
摘要 Provided are a substrate with an etching mask which enables high definition patterning and a method of manufacturing the same. A photosensitive material is applied on a surface of a substrate, exposure and development of the photosensitive material are carried out to form a resist pattern, a DLC coating film is formed on the surface of the substrate and a surface of the resist pattern, and the DLC coating film formed on the resist pattern is separated together with the resist pattern to form a DLC pattern on the surface of the substrate.
申请公布号 US2013337231(A1) 申请公布日期 2013.12.19
申请号 US201213980695 申请日期 2012.02.08
申请人 SHIGETA KAKU;SUGAWARA SHINTARO;SHIGETA TATSUO;THINK LABORATORY CO., LTD. 发明人 SHIGETA KAKU;SUGAWARA SHINTARO;SHIGETA TATSUO
分类号 G03F7/40 主分类号 G03F7/40
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