发明名称 TRANSISTOR DEVICE WITH REDUCED GATE RESISTANCE
摘要 A device with reduced gate resistance includes a gate structure having a first conductive portion and a second conductive portion formed in electrical contact with the first conductive portion and extending laterally beyond the first conductive portion. The gate structure is embedded in a dielectric material and has a gate dielectric on the first conductive portion. A channel layer is provided over the first conductive portion. Source and drain electrodes are formed on opposite end portions of a channel region of the channel layer. Methods for forming a device with reduced gate resistance are also provided.
申请公布号 US2013337618(A1) 申请公布日期 2013.12.19
申请号 US201313972290 申请日期 2013.08.21
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HAN SHU-JEN;VALDES GARCIA ALBERTO
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
主权项
地址