APPARATUS FOR DETECTING DETERIORATION OF POWER MODULE

摘要

Disclosed is an apparatus for detecting deterioration of a power module having a built-in semiconductor chip (100). The apparatus is provided with a deterioration detection processing unit (10), which performs deterioration detection processing on the basis of transmission characteristics between alternating current signals included in temperature signals (S1) obtained by detecting the temperature of the semiconductor chip (100), and alternating current components included in power loss signals (S3) obtained by detecting the power loss of the semiconductor chip (100). The deterioration level of the power module is reliably detected by eliminating influence of temperature interference due to other heat generating sources.