| 摘要 |
The present inventions are related to apparatuses and methods for detecting and classifying media defects. For example, an apparatus for classifying a media defect is disclosed including a DFT circuit operable to yield real and imaginary components of a signal derived from data read from a storage medium, a calculation circuit operable to calculate an amplitude and a phase of the signal based on the real and imaginary components, and a classifier operable to detect the media defect based on the amplitude and to classify the media defect based on the phase. |
