发明名称 |
PHOTO MASK AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a photo mask used in a photo lithography technology having an ArF excimer laser as an exposure light source and performing exposure by oblique incident light using a pupil filter, capable of reducing an influence of a three-dimensional effect of a photo mask pattern and increasing a pattern exposure tolerance of the photo mask, and also to provide a manufacturing method thereof.SOLUTION: The photo mask is a half tone mask 10 obtained by forming a mask pattern 16 through providing a semi-transparent film pattern 12 that transmits exposure light onto a transparent substrate 11 at a predetermined transmission ratio to change phases. A side wall part of the semi-transparent pattern 12 is covered with a side wall extinction film 15 that extinguishes the exposure light. |
申请公布号 |
JP2013254098(A) |
申请公布日期 |
2013.12.19 |
申请号 |
JP20120129866 |
申请日期 |
2012.06.07 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
WATANABE KOJI;HAYANO KATSUYA;OKAWA YOHEI;MESHIDA TAKASHI;KOKUBO HARUO;TSUJIMOTO EIJI;TAKAMIZAWA HIDEYOSHI |
分类号 |
G03F1/32;G02B5/00;H01L21/027 |
主分类号 |
G03F1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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