发明名称 THREE-DIMENSIONAL MEASUREMENT APPARATUS, AND THREE-DIMENSIONAL MEASUREMENT METHOD
摘要 <p>A lattice is projected several times, onto an object to be measured, from different positions or with different pitches, and images of the projected lattice are captured and analysed to obtain a three-dimensional shape of the object to be measured. Pixels in which a position in three-dimensional space obtained from an image including the object to be measured and background differs by at least a prescribed value from a position in three-dimensional space obtained from a background image which does not include the object to be measured are extracted as pixels belonging to the object to be measured. As a result, the background and the object to be measured can be accurately separated, even if surfaces having high refractive indices are not included in the background.</p>
申请公布号 WO2013187202(A1) 申请公布日期 2013.12.19
申请号 WO2013JP64276 申请日期 2013.05.22
申请人 SHIMA SEIKI MFG., LTD. 发明人 IWAI KAZUTAKA
分类号 G01B11/25 主分类号 G01B11/25
代理机构 代理人
主权项
地址