发明名称 METHOD FOR PRODUCING RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a method for producing a resist composition that can give a resist pattern with small line edge roughness (LER).SOLUTION: A method for producing a resist pattern includes steps of: (1) applying a following resist composition on a substrate; (2) drying the applied resist composition to form a composition layer; (3) exposing the composition layer; (4) heating the exposed composition layer; and (5) developing the heated composition layer with a negative developing solution. The resist composition comprises: a resin (A1) having a structural unit expressed by formula (I) and a structural unit having an acid-labile group; a resin (A2) that includes a fluorine atom and is soluble in a negative developing solution; an acid generator; and a solvent. In the formula, Rrepresents an alkyl group having 1 to 6 carbon atoms, which may have a halogen atom, or the like; and ring Xrepresents a heterocycle having 2 to 36 carbon atoms.
申请公布号 JP2013254187(A) 申请公布日期 2013.12.19
申请号 JP20130001598 申请日期 2013.01.09
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ICHIKAWA KOJI;YASUE TAKAHIRO;FUJITA SHINGO
分类号 G03F7/038;C08F20/58;C09K3/00;G03F7/004;G03F7/039;G03F7/32;H01L21/027 主分类号 G03F7/038
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