发明名称 METHOD FOR FORMING WIRING, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide: a wiring which is formed using a conductive film containing copper and whose shape is controlled; a transistor including an electrode which is formed in the same layer as the wiring; and a semiconductor device including the transistor and the wiring.SOLUTION: For a laminated film comprising a first conductive film containing copper and a second conductive film over the first conductive film: a resist mask is formed over the second conductive film; part of the second conductive film and part of the first conductive film are removed by using the resist mask as a mask so as to form the first conductive film with a taper angle in the range from 15° to 45° inclusive; and then the resist mask is removed.
申请公布号 JP2013254946(A) 申请公布日期 2013.12.19
申请号 JP20130098209 申请日期 2013.05.08
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SATO TAKAHIRO;CHO TAKAYUKI;KOSHIOKA SHUNSUKE;OSHIMA TETSUYA;SAKAMOTO NAOYA
分类号 H01L29/41;G02F1/1368;H01L21/28;H01L21/336;H01L29/786;H01L51/50;H05B33/08;H05B33/10;H05B33/14 主分类号 H01L29/41
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