发明名称 |
METHOD FOR FORMING WIRING, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide: a wiring which is formed using a conductive film containing copper and whose shape is controlled; a transistor including an electrode which is formed in the same layer as the wiring; and a semiconductor device including the transistor and the wiring.SOLUTION: For a laminated film comprising a first conductive film containing copper and a second conductive film over the first conductive film: a resist mask is formed over the second conductive film; part of the second conductive film and part of the first conductive film are removed by using the resist mask as a mask so as to form the first conductive film with a taper angle in the range from 15° to 45° inclusive; and then the resist mask is removed. |
申请公布号 |
JP2013254946(A) |
申请公布日期 |
2013.12.19 |
申请号 |
JP20130098209 |
申请日期 |
2013.05.08 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
SATO TAKAHIRO;CHO TAKAYUKI;KOSHIOKA SHUNSUKE;OSHIMA TETSUYA;SAKAMOTO NAOYA |
分类号 |
H01L29/41;G02F1/1368;H01L21/28;H01L21/336;H01L29/786;H01L51/50;H05B33/08;H05B33/10;H05B33/14 |
主分类号 |
H01L29/41 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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