发明名称 |
SYSTEMS AND METHODS FOR PRECISION OPTICAL IMAGING OF ELECTRICAL CURRENTS AND TEMPERATURE IN INTEGRATED CIRCUITS |
摘要 |
Systems and methods for precision optical imaging of electrical currents and temperature in integrated circuits are disclosed herein. In one aspect of the disclosed subject matter, a method for detecting a characteristic of an integrated circuit can include depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit. |
申请公布号 |
WO2013188732(A1) |
申请公布日期 |
2013.12.19 |
申请号 |
WO2013US45795 |
申请日期 |
2013.06.14 |
申请人 |
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK |
发明人 |
ENGLUND, DIRK, R.;TRUSHEIM, MATTHEW, E. |
分类号 |
G01R19/00 |
主分类号 |
G01R19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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