| 摘要 |
Systems in which multi-bit PCM is used, including memory systems, as well as methods for operating such systems. A test of multi-bit PCM memory elements with known states can be used to determine whether immediately available voltage levels can reliably read multi-bit PCM. This can be used to accelerate availability of memory states residing in multi-bit PCM with respect to, for example, redundancy address storage, other startup state information, and parameters for which nonvolatile storage is useful. |
