发明名称 Interlock switch circuit with single fault detection
摘要 <p>A testing system to test safety interlock switches to ensure that they are operating normally comprising a test loop circuit 16 which connects in series a plurality of safety switches 2, the test loop circuit 16 is adapted to open the switches 2 outputs if broken, the testing system further comprising a diagnostic means 18 which checks each switch to ensure it is operating normally when the test loop circuit 16 is broken. The test loop circuit 16 may be broken when a single switch 2 is activated to open its safety output.</p>
申请公布号 EP2645389(A3) 申请公布日期 2013.12.18
申请号 EP20130161717 申请日期 2013.03.28
申请人 IDEM SAFETY SWITCHES LIMITED 发明人 JENNINGS, TIMOTHY;CROLLA, VINCENT;MOHTASHAM, MEDI;FARIDFAR, HAMED
分类号 H01H9/22 主分类号 H01H9/22
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