发明名称 |
Device and method for detecting resistive defect |
摘要 |
The invention provides a device and method for detecting a resistive defect in a static random access memory (SRAM) device. A first aspect of the invention provides a static random access memory (SRAM) device comprising: a bitline; a wordline; a bitline precharge circuit electrically connected to the bitline and adapted to provide to the bitline a first precharge voltage for precharging the bitline during normal operation of the SRAM device and a second precharge voltage less than the first precharge voltage for testing the SRAM device for a resistive defect between the bitline and the wordline. |
申请公布号 |
US8611164(B2) |
申请公布日期 |
2013.12.17 |
申请号 |
US201113195114 |
申请日期 |
2011.08.01 |
申请人 |
BRACERAS GEORGE MARIA;PILO HAROLD;RUDGERS GEORGE E.;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BRACERAS GEORGE MARIA;PILO HAROLD;RUDGERS GEORGE E. |
分类号 |
G11C29/00;G11C7/12 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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