发明名称 Semiconductor package having through electrodes that reduce leakage current and method for manufacturing the same
摘要 A stacked semiconductor package having through electrodes that exhibit a reduced leakage current and a method of making the same are presented. The stacked semiconductor package includes a semiconductor chip, through-holes, and a current leakage prevention layer. The semiconductor chip has opposing first and second surfaces. The through-holes pass entirely through the semiconductor chip and are exposed at the first and second surfaces. A polarized part is formed on at least one of the first and second surfaces of the semiconductor chip. The through-electrodes are disposed within the through-holes. The current leakage prevention layer covers the polarized part and exposes ends of the through-electrodes.
申请公布号 US8609535(B2) 申请公布日期 2013.12.17
申请号 US201113286376 申请日期 2011.11.01
申请人 JO SEUNG HEE;KIM SUNG CHEOL;KIM SUNG MIN;HYNIX SEMICONDUCTOR INC. 发明人 JO SEUNG HEE;KIM SUNG CHEOL;KIM SUNG MIN
分类号 H01L21/283 主分类号 H01L21/283
代理机构 代理人
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