发明名称 Method for manufacturing semiconductor device
摘要 A method for manufacturing a semiconductor device includes the steps of: preparing a combined wafer; obtaining a first intermediate wafer by forming an active layer; obtaining a second intermediate wafer by forming a front-side electrode on the first intermediate wafer; supporting the second intermediate wafer by adhering an adhesive tape at the front-side electrode side; removing the supporting layer while supporting the second intermediate wafer using the adhesive tape; forming a backside electrode on the main surfaces of SiC substrates exposed by the removal of the supporting layer; adhering an adhesive tape at the backside electrode side and removing the adhesive tape at the front-side electrode side so as to support the plurality of SiC substrates using the adhesive tape; and obtaining a plurality of semiconductor devices by cutting the SiC substrates with the SiC substrates being supported by the adhesive tape provided at the backside electrode side.
申请公布号 US8609513(B2) 申请公布日期 2013.12.17
申请号 US201113510570 申请日期 2011.07.21
申请人 HORII TAKU;SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 HORII TAKU
分类号 H01L21/78;H01L21/46;H01L21/50;H01L21/76 主分类号 H01L21/78
代理机构 代理人
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