| 摘要 |
<p>A server (300) stores a plurality of pieces of configuration data (306). Tester hardware (100) is configured such that at least a portion of a function thereof is changeable in response to the configuration data (306) which is stored in a rewritable non-volatile memory (102), and is configured to be capable of supplying a power source voltage to a DUT (4), transmitting a signal to the DUT (4), and receiving a signal from the DUT (4). When setting up a (i) test system (2), an information processing device (200) acquires the configuration data (306) from the server (300) in answer to a user input, and writes same to the nonvolatile memory (102). Additionally, the information processing device (200) is configured to be able, when testing the (ii) DUT (4), to execute a test program, control the tester hardware (100), and process data which is acquired by the tester hardware (100).</p> |
