<p>A test program controls tester hardware (100). The tester hardware (100) is configured so that at least a portion of functions thereof can be changed in response to configuration data (306) stored in a rewritable nonvolatile memory (102). This test program is provided with a workflow display control function for displaying a workflow in a display device of an information processing device in a form whereby a workflow can be selected by a user, and an input screen display control function for displaying an input screen that corresponds to a work selected from among workflows in the display device.</p>