DATA CORRECTION METHOD IN FINE PARTICLE MEASURING DEVICE AND FINE PARTICLE MEASURING DEVICE

摘要

Provided is a technology whereby the intensity and spectrum of fluorescence and scattered light can be measured with a high degree of accuracy by effectively correcting the measurement error caused by an inconsistency in the flow position in the flow channel of fine particles. Provided is a data correction method in a fine particle measuring device comprising: an intensity detection process which allows for detecting light emitted from fine particles by radiating light onto the fine particles flowing in the flow channel to acquire the intensity information of the light; a position detection process for acquiring the positional information of the fine particles; and a correction process for correcting the intensity information on the basis of the positional information. In the position detection process of the data correction method, a detector receives the astigmatic S polarized component that was separated from the scattered light emitted from the fine particles so that the receiving position of the S polarized component in the detector is acquired as the positional information.