发明名称 STRUCTURE ANALYSIS DEVICE AND STRUCTURE ANALYSIS METHOD
摘要 <p>Provided are a structure analysis device and structure analysis method capable of analyzing changes in the condition of a structure such as deterioration at a stage prior to the structure being destroyed. This structure analysis device (10) is provided with a vibration detection means (11) for detecting vibrations of the structure and an analysis means (12) for analyzing the output signal of the vibration detection means (11). The analysis means (12) analyzes changes in the condition of the structure by comparing the value of a resonance quality factor (Q) calculated with formula (1) in a reference state and the value in the state at the time of analysis. Q = f/Deltaf (1) f: resonance frequency of structure Deltaf: frequency width at half peak value</p>
申请公布号 WO2013183313(A1) 申请公布日期 2013.12.12
申请号 WO2013JP50415 申请日期 2013.01.11
申请人 NEC CORPORATION;SASAKI YASUHIRO;TAKAHASHI MASATAKE;SHINODA SHIGEKI 发明人 SASAKI YASUHIRO;TAKAHASHI MASATAKE;SHINODA SHIGEKI
分类号 G01H17/00;G01M99/00;G01N3/30;G01N29/12 主分类号 G01H17/00
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