发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To reduce characteristic variations of a plurality of hookup transistors.SOLUTION: A semiconductor memory includes: a memory cell array 10 having a plurality of memory cells and first and second dummy cells; a plurality of word lines connected to the plurality of memory cells; first dummy word lines connected to the first dummy cells; second dummy word lines connected to the second dummy cells; and row decoders 12. The row decoders 12 include: a plurality of hookup transistors individually connected to the plurality of word lines; first dummy hookup transistors connected to the first dummy word lines; and second dummy hookup transistors connected to the second dummy word lines. The first and second dummy hookup transistors are disposed on at least one end portion of a hookup transistor group.
申请公布号 JP2013251034(A) 申请公布日期 2013.12.12
申请号 JP20120127176 申请日期 2012.06.04
申请人 TOSHIBA CORP 发明人 HE DONG;ISOBE KATSUAKI
分类号 G11C16/06;G11C16/04;H01L21/336;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 G11C16/06
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