| 摘要 |
Better performance can be provided for a display system that has semiconductor microelectronic components such as demultiplexors, gate line and data line drivers, and pixel switches formed on the display substrate, e.g., a glass substrate that constitutes part of an active matrix display panel. A gate source capacitance of a constituent transistor of one of these microelectronic components, e.g., a pixel thin film transistor (TFT) that is part of a particular display element, may be measured using a replica component that emulates the behavior of the component. |
