发明名称 STRUCTURE FOR CREATING OHMIC CONTACT IN SEMICONDUCTORS
摘要 <p>A semiconductor-to-metal interface with ohmic contact is provided. The interface includes a semiconductor material, a metal layer, and a silicon carbide layer disposed between the semiconductor material and the metal layer. The silicon carbide layer causes the formation of a semiconductor-to-metal interface with ohmic contact. Applications include forming a photovoltaic device with ohmic contact by disposing a layer of silicon carbide over the photovoltaic material before depositing a bottom electrode layer of metal to complete the bottom of a photovoltaic cell.</p>
申请公布号 WO2013184721(A1) 申请公布日期 2013.12.12
申请号 WO2013US44174 申请日期 2013.06.04
申请人 NUSOLA INC. 发明人 YAMAGUCHI, ATSUSHI;BRICENO, JOSE
分类号 H01L31/028;H01L31/0312 主分类号 H01L31/028
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