| 摘要 |
PROBLEM TO BE SOLVED: To provide a test program of a tester that can easily and properly test various kinds of test devices.SOLUTION: A test program controls tester hardware 100. The tester hardware 100 is configured so as to be able to change at least part of its function according to configuration data 306 that is stored in a rewritable nonvolatile memory 102. This test program includes: a process flow display control function that makes a display device of an information processing device display a process flow in a user-selectable state; and an input screen display control function that makes the display device display an input screen corresponding to a process that is selected from the process flow. |
