发明名称 METHOD AND DEVICE FOR ANALYZING SURFACE PROFILE
摘要 PROBLEM TO BE SOLVED: To improve reliability by easily measuring a surface profile of an object and removing data components such as disturbance vibration and surface roughness from measurement data.SOLUTION: An object 9 is held with a holder 13. While the object 9 is repeatedly reciprocated a plurality of times, relative to an irradiation section 35 in a scanning direction x by moving means 40, a surface profile is optically measured by measuring means 30 to acquire repetitive measurement data. Extraction means 33 tries to extract a data component of a prescribed frequency in the repetitive measurement data.
申请公布号 JP2013250080(A) 申请公布日期 2013.12.12
申请号 JP20120123199 申请日期 2012.05.30
申请人 FUKUDA:KK 发明人 SASAKI TORU;HOJO TSUTOMU;MOCHIZUKI YUSUKE;AIDA TOMOHIRO
分类号 G01B11/24;G01M3/32 主分类号 G01B11/24
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