DEFECT SEARCH DEVICE, SCAN DEVICE AND DEFECT SEARCH METHOD

摘要

PROBLEM TO BE SOLVED: To search for a defect of both sides of an object in a short time.SOLUTION: An ultrasonics automatic angle-beam flaw detection device 1 comprises: a scanner device 3 shifting on a surface S0 of an object 61 that defect is searched for; a first probe 14 provided on the scanner device 3 and inputting ultrasonics from the surface S0 of the object 61 and detects reflected wave; an amplifier amplifying a detection signal output from the first probe 14; a memory unit 37 accumulating the detection signals amplified by the amplifier and storing the waveform of the detection signal; and an analysis unit 46 searching for the defect of the object 61 by analyzing the waveform of the detection signal stored in the memory unit 37. The first probe 14 inputs ultrasonics to be dispersed in the object 61 to the object 61 and output the detection signal including dispersed and reflected ultrasonic reflected wave component. The amplifier amplifies the dispersed and reflected ultrasonic reflected wave component included in the detection signal with a first log amplifier 31.