发明名称 X-RAY INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection apparatus capable of highly accurately detecting breaking of a filament.SOLUTION: An X-ray inspection apparatus 1 includes: an X-ray tube 12 having plural filaments, a first filament 71 and a second filament 72, in a cathode; an X-ray tube current detector 76 for detecting current flowing from the cathode to an anode of the X-ray tube 12 as X-ray tube current; and a controller 46 for determining breaking of any of the first filament 71 and the second filament 72 on the basis of the X-ray tube current detected by the X-ray tube current detector 76 when voltage is applied from the cathode to the anode of the X-ray tube 12.
申请公布号 JP2013251121(A) 申请公布日期 2013.12.12
申请号 JP20120124726 申请日期 2012.05.31
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 MITANI SATOSHI
分类号 H05G1/26;G01N23/04;H05G1/34 主分类号 H05G1/26
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