发明名称 METHODS FOR TEXTURING A SEMICONDUCTOR MATERIAL
摘要 A method for modifying the texture of a semiconductor material is provided. The method includes performing a first texture step comprising reactive ion etching to a first surface of semiconductor material. After the first texture step, the first surface of the semiconductor material has a random texture comprising a plurality of peaks and a plurality of valleys, and wherein at least fifty percent of the first surface has a peak-to-valley height of less than one micron and an average peak-to-peak distance of less than one micron. Additional texture steps comprising wet etch or RIE etching may be optionally applied.
申请公布号 US2013330871(A1) 申请公布日期 2013.12.12
申请号 US201213494687 申请日期 2012.06.12
申请人 NEWMAN BONNA;MURALI VENKATESAN;LI ZHIYONG;CHEN LIANG;TWIN CREEKS TECHNOLOGIES, INC. 发明人 NEWMAN BONNA;MURALI VENKATESAN;LI ZHIYONG;CHEN LIANG
分类号 H01L31/18 主分类号 H01L31/18
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