发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR WAFER INCLUDING SILICON-BASED ADHESIVE LAYER
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor wafer including a silicon-based adhesive layer with an even thickness on a surface, without including air bubbles between a semiconductor wafer and the silicon-based adhesive layer.SOLUTION: There is provided a method of manufacturing a semiconductor wafer including a silicon-based adhesive layer. The method comprises at least the following steps: (1) a step of applying a liquid silicon-based adhesive agent on one surface of a semiconductor wafer and (2) a step of coating the surface of the adhesive agent with a non-fluorine detachable film, or a step of simultaneously performing the step (1) and the step (2), and (3) a subsequent step of curing the adhesive agent in a certain thickness with the detachable film adhered.
申请公布号 JP2013251430(A) 申请公布日期 2013.12.12
申请号 JP20120125834 申请日期 2012.06.01
申请人 DOW CORNING TORAY CO LTD 发明人 FUJISAWA TOYOHIKO;ONISHI MASAYUKI
分类号 H01L21/52;C09J11/02;C09J183/04;C09J183/05;C09J183/07 主分类号 H01L21/52
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