发明名称 METHOD OF FORMING THIN FILM POLY SILICON LAYER AND METHOD OF FORMING THIN FILM TRANSISTOR
摘要 A method of forming a thin film poly silicon layer includes following steps. Firstly, a substrate is provided. A heating treatment is then performed. A thin film poly silicon layer is then directly formed on a first surface of the substrate by a silicon thin film deposition process. A method of forming a thin film transistor includes following steps. Firstly, a substrate is provided. A heating treatment is then performed. A thin film poly silicon layer is then directly formed on a first surface of the substrate by a silicon thin film deposition process. A first patterning process is performed on the thin film poly silicon layer to form a semiconductor pattern. Subsequently, a gate insulation layer, a gate electrode, a source electrode and a drain electrode are formed.
申请公布号 US2013330886(A1) 申请公布日期 2013.12.12
申请号 US201313912199 申请日期 2013.06.07
申请人 WINTEK CORPORATION 发明人 HUANG HIENG-HSIUNG;WANG WEN-CHUN;CHANG HENG-YI;LIU CHIN-CHANG
分类号 H01L21/02;H01L29/786 主分类号 H01L21/02
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