发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR SUBSTRATE HAVING MASK PATTERN FOR HIGH QUALITY SEMICONDUCTOR DEVICE
摘要 The present invention relates to a high quality semiconductor substrate manufacturing method including a step of forming a nitride semiconductor layer and a mask patter on a substrate such as a sapphire substrate, a step of reforming the surface to become porous using a dry etching method before or after growing the nitride semiconductor layer once again, a step of re-growing the nitride semiconductor layer with a low defect density as a template layer, and a step of producing a high quality semiconductor device with an improved inner quantum yield and a light extraction efficiency. [Reference numerals] (S10) Form a nitride semiconductor layer;(S20) Form an insulating film pattern;(S30) Dry porous etch;(S40) Re-grow the nitride semiconductor layer
申请公布号 KR20130135440(A) 申请公布日期 2013.12.11
申请号 KR20120058992 申请日期 2012.06.01
申请人 KOREA POLYTECHNIC UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION 发明人 NAM, OK HYUN;LEE, WON SEOK;LEE, DONG HEON;WOO, SEO HWI;JANG, JONG JIN
分类号 H01L33/22 主分类号 H01L33/22
代理机构 代理人
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