发明名称 |
SEMICONDUCTOR ISOLATION STRUCTURE WITH AIR GAPS IN DEEP TRENCHES |
摘要 |
According to the embodiment of the present invention, a device includes a semiconductor substrate, a contact plug which is located on the semiconductor substrate, and an interlayer dielectric (ILD). The contact plug is arranged on the ILD. An air gap is sealed by a part of the ILD and the semiconductor substrate. The air gap forms a full air gap ring which surrounds the part of the semiconductor substrate. |
申请公布号 |
KR20130135709(A) |
申请公布日期 |
2013.12.11 |
申请号 |
KR20120116136 |
申请日期 |
2012.10.18 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
SHUE HONG SENG;YANG TAI I;WU WEI DING;CHUNG MING TAI;YU SHAO CHI |
分类号 |
H01L21/762;H01L21/336;H01L29/78 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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