发明名称 SEMICONDUCTOR ISOLATION STRUCTURE WITH AIR GAPS IN DEEP TRENCHES
摘要 According to the embodiment of the present invention, a device includes a semiconductor substrate, a contact plug which is located on the semiconductor substrate, and an interlayer dielectric (ILD). The contact plug is arranged on the ILD. An air gap is sealed by a part of the ILD and the semiconductor substrate. The air gap forms a full air gap ring which surrounds the part of the semiconductor substrate.
申请公布号 KR20130135709(A) 申请公布日期 2013.12.11
申请号 KR20120116136 申请日期 2012.10.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 SHUE HONG SENG;YANG TAI I;WU WEI DING;CHUNG MING TAI;YU SHAO CHI
分类号 H01L21/762;H01L21/336;H01L29/78 主分类号 H01L21/762
代理机构 代理人
主权项
地址