发明名称 MULTI MOIRE VISION INSPECTION APPARATUS USING ONE PERIOD GRID
摘要 A multi-moire vision inspection device using a single cycle grid determines the defect of an inspected object by comparing an image photographed for the inspected object with a predetermined inputted image. The present invention comprises a stage unit, an illumination unit, a camera unit, a plaid irradiation unit, a vision processing unit, a control unit, and a plaid rotation member of the plaid irradiation unit. The stage unit fixes the inspected object on an inspected position or transfers the same. The illumination unit is positioned in the upper part of the stage unit and offers illumination to the inspected object. The camera unit is positioned in the center of the illumination unit and obtains the image of the inspected object. The plaid irradiation unit is arranged in a side of the camera unit. The vision processing unit determines the defect of the inspected object by reading the image photographed in a center camera unit. The control unit controls compositions. The present invention displays the effectiveness of using a plurality of grids by using only one single cycle grid. The present invention rapidly and accurately measures the height of the inspected object.
申请公布号 KR20130134279(A) 申请公布日期 2013.12.10
申请号 KR20120057685 申请日期 2012.05.30
申请人 MIRTEC CO., LTD. 发明人 PAK, CHAN WHA;LEE, DONG HYUN;KIM, SUNG HYUN;KIM, YOUNG DOO
分类号 G01N21/88;G01B11/25 主分类号 G01N21/88
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