发明名称 SELECTING REFERENCE LIBRARIES FOR MONITORING OF MULTIPLE ZONES ON A SUBSTRATE
摘要 A method of configuring a polishing monitoring system includes receiving user input selecting a plurality of libraries, each library of the plurality of libraries comprising a plurality of reference spectra for use in matching to measured spectra during polishing, each reference spectrum of the plurality of reference spectra having an associated index value, for a first zone of a substrate, receiving user input selecting a first subset of the plurality of libraries, and for a second zone of the substrate, receiving user input selecting a second subset of the plurality of libraries.
申请公布号 KR20130135237(A) 申请公布日期 2013.12.10
申请号 KR20137005009 申请日期 2011.07.22
申请人 APPLIED MATERIALS, INC. 发明人 QIAN JUN;SWEDEK BOGUSLAW A.;LEE HARRY Q.;DAVID JEFFREY DRUE;DHANDAPANI SIVAKUMAR;OSTERHELD THOMAS H.
分类号 H01L21/304;H01L21/66 主分类号 H01L21/304
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