发明名称 Matching method for two-dimensional pattern, feature extracting method, apparatus used for the methods, and programs
摘要 A 2-dimensional pattern matching method contains a process of extracting a query feature data by projecting a vector representation of either of a query 2-dimensional pattern and a transformed query 2-dimensional pattern which is generated by transforming the query 2-dimensional pattern, to a feature space. An enrollment feature data as previously enrolled and a query feature data are inversely projected to the 2-dimensional pattern representation space which has the dimension of the vector representation and the similarity is calculated. The data size of a feature amount is small and a matching technique robust to the positional displacement and the image distortion is provided.
申请公布号 US8606019(B2) 申请公布日期 2013.12.10
申请号 US20080597119 申请日期 2008.04.21
申请人 KAMEI TOSHIO;NEC CORPORATION 发明人 KAMEI TOSHIO
分类号 G06K9/46 主分类号 G06K9/46
代理机构 代理人
主权项
地址