发明名称 |
Matching method for two-dimensional pattern, feature extracting method, apparatus used for the methods, and programs |
摘要 |
A 2-dimensional pattern matching method contains a process of extracting a query feature data by projecting a vector representation of either of a query 2-dimensional pattern and a transformed query 2-dimensional pattern which is generated by transforming the query 2-dimensional pattern, to a feature space. An enrollment feature data as previously enrolled and a query feature data are inversely projected to the 2-dimensional pattern representation space which has the dimension of the vector representation and the similarity is calculated. The data size of a feature amount is small and a matching technique robust to the positional displacement and the image distortion is provided. |
申请公布号 |
US8606019(B2) |
申请公布日期 |
2013.12.10 |
申请号 |
US20080597119 |
申请日期 |
2008.04.21 |
申请人 |
KAMEI TOSHIO;NEC CORPORATION |
发明人 |
KAMEI TOSHIO |
分类号 |
G06K9/46 |
主分类号 |
G06K9/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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