发明名称 Power-on test system for testing storage device and test method employing the same
摘要 A power-on test system for testing a storage device, the power-on test system includes a computer, a signal microcontroller, a switch unit, and a power source. The computer includes a counter capable of recording the number of power-on times of the storage device. The computer prompts the signal microcontroller to turn on or off the switch unit according to a preset frequency, the power source electrically connects to or disconnects from the storage device through the switch unit, the storage device outputs corresponding power-on status signals and power-off status signals to the computer, and the counter increases by one after each power-on testing.
申请公布号 US8607079(B2) 申请公布日期 2013.12.10
申请号 US201113155320 申请日期 2011.06.07
申请人 CHEN TZU-CHIEN;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 CHEN TZU-CHIEN
分类号 G06F1/26 主分类号 G06F1/26
代理机构 代理人
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