| 摘要 |
A semiconductor device includes: a control signal generation part generating a control signal in response to a set signal, a test signal, and a test reset signal; a first test selection part generating a first test mode signal in response to a first selection signal and the control signal; a second test signal generation part generating a second test mode signal in response to a second selection signal and the control signal; and a test reset signal generation part outputting the second test mode signal as the test reset signal. [Reference numerals] (100) Control signal generation part;(210) First test selection part;(220) Second test selection part;(230) Third test selection part;(240) Fourth test selection part;(250) Fifth test selection part;(300) Test reset signal generation part |
