发明名称 ELECTRICAL TEST PROBE
摘要 The present invention provides a current test probe which can control the temperature increase caused by currents and has excellent electrical and mechanical properties. The current test probe of the present invention comprises: a main body part which has a connecting end to the circuit of a probe substrate and is made of first metallic materials; and a needle part which is extended from the main body part, is made of second metallic materials having higher longitude than the first metallic materials, and is composed of a needle. A current path from the needle to the connecting end is formed in the main body part and the needle part and is made of the same metallic materials.
申请公布号 KR20130133669(A) 申请公布日期 2013.12.09
申请号 KR20130056384 申请日期 2013.05.20
申请人 KABUSHIKI KAISHA NIHON MICRONICS 发明人 HIRAKAWA HIDEKI;KANAZAWA YUKO
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
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