发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>The present invention relates to a method for forming a semiconductor device capable of increasing a channel size by surrounding a pin by a gate in a 6F^2 buried saddle fin gate structure transistor. The method for forming the semiconductor device comprises a step for defining an active area by forming a device separation film on a semiconductor substrate; a step for forming a first recess having a predetermined depth on the active area; a step for forming a sacrificial film having a predetermined thickness on the lower part in the first recess; a step for forming a pin on the upper part of the sacrificial film; a step for separating the pin from the active area to the upper part by removing the sacrificial film; and a step for forming a gate in order to surround the pin.</p>
申请公布号 KR20130133559(A) 申请公布日期 2013.12.09
申请号 KR20120056911 申请日期 2012.05.29
申请人 SK HYNIX INC. 发明人 CHO, YOUNG MAN
分类号 H01L21/336;H01L21/8242;H01L27/108;H01L29/78 主分类号 H01L21/336
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