发明名称 METHOD FOR MANUFACTURING THIN FILM BONDED SUBSTRATE FOR SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a thin film bonded substrate for a semiconductor element capable of eliminating a conventional conductive barrier layer, and preventing a decrease in a reflective layer function due to a high temperature step and occurrence of a crack due to the difference between thermal expansion coefficients.SOLUTION: A method for manufacturing a thin film bonded substrate for a semiconductor element includes the steps of: growing an epitaxial growth layer on a first substrate composed of a bulk crystal (S1); forming an ion implantation layer from a boundary surface of the first substrate forming a boundary with one surface of the epitaxial growth layer to a prescribed depth (S2); bonding a third substrate to the other surface of the epitaxial growth layer (S3); separating the first substrate using the ion implantation layer as the boundary and forming a crystalline thin film separated from the first substrate on the one surface of the epitaxial growth layer (S4); bonding a second substrate to the crystalline thin film (S5); and removing the third substrate (S6).
申请公布号 JP2013247362(A) 申请公布日期 2013.12.09
申请号 JP20130108130 申请日期 2013.05.22
申请人 SAMSUNG CORNING PRECISION MATERIALS CO LTD 发明人 KIM DONGHYUN;KIM DONG-WOON;KIM MI KYUNG;KIM MIN-JOO;KIM A-RA;KIM HYUN-JIN;SHUR JOONG WON;WO KWANG-JE;LEE BOHYUN;JEON JONGPIL;JUNG KYUNGSUB
分类号 H01L21/02;H01L21/20;H01L33/02 主分类号 H01L21/02
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