发明名称 CIS IMAGE SENSORS WITH EPITAXY LAYERS AND METHODS FOR FORMING THE SAME
摘要 <p>A method includes a step for performing a first epitaxy to grow a fist epitaxy layer of a first conductivity type, and a step for performing a second epitaxy to grow a second epitaxy layer of a second conductivity type opposite to the first conductivity type on the first epitaxy layer. A diode is formed on the first and the second expitaxy layer. The method further includes a step for forming a gate dielectric on the first epitaxy; a step for forming a gate electrode on the gate dielectric; and a step for injecting the uppermost part of the first and the second expitaxy layer to form a source/drain region near the gate dielectric.</p>
申请公布号 KR20130133657(A) 申请公布日期 2013.12.09
申请号 KR20130013405 申请日期 2013.02.06
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 JANGJIAN SHIU KO;HONG MIN HAO;CHEN KEI WEI;JENG CHI CHERNG
分类号 H01L27/146;H01L27/14 主分类号 H01L27/146
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