发明名称 |
CIS IMAGE SENSORS WITH EPITAXY LAYERS AND METHODS FOR FORMING THE SAME |
摘要 |
<p>A method includes a step for performing a first epitaxy to grow a fist epitaxy layer of a first conductivity type, and a step for performing a second epitaxy to grow a second epitaxy layer of a second conductivity type opposite to the first conductivity type on the first epitaxy layer. A diode is formed on the first and the second expitaxy layer. The method further includes a step for forming a gate dielectric on the first epitaxy; a step for forming a gate electrode on the gate dielectric; and a step for injecting the uppermost part of the first and the second expitaxy layer to form a source/drain region near the gate dielectric.</p> |
申请公布号 |
KR20130133657(A) |
申请公布日期 |
2013.12.09 |
申请号 |
KR20130013405 |
申请日期 |
2013.02.06 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
JANGJIAN SHIU KO;HONG MIN HAO;CHEN KEI WEI;JENG CHI CHERNG |
分类号 |
H01L27/146;H01L27/14 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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