| 摘要 |
PROBLEM TO BE SOLVED: To provide a secondary battery inspection method for detecting micro short circuit in a secondary battery having great internal resistance variation.SOLUTION: An inspection method of a secondary battery 1 includes: a first aging step of performing first aging processing after charging or discharging the secondary battery 1 up to a first SOC, and measuring a first amount of voltage drop &Dgr;VA of the secondary battery 1 in the first aging processing; a second aging step of performing second aging processing after charging or discharging the secondary battery 1 up to a second SOC higher than the first SOC, and measuring a second amount of voltage drop &Dgr;VB of the secondary battery 1 in the second aging processing; and a determination step of determining micro short circuit in the secondary battery 1 by use of a correction coefficient K for correcting changes in the first amount of voltage drop &Dgr;VA, the second amount of voltage drop &Dgr;VB, and an amount of voltage drop in the secondary battery 1 due to the SOC. |
