发明名称 TEST AND MEASUREMENT INSTRUMENT AND METHOD
摘要 PROBLEM TO BE SOLVED: To enable detection of an extremely subtle variation in statistical properties of a measured signal.SOLUTION: A test and measurement instrument converts digital data that represents an analog input signal into a time-domain bitmap, and then compares a density value in a region inside the time-domain bitmap to a density threshold. When the density value in the region violates the density threshold, a trigger signal is generated which causes digital data to be stored in a memory.
申请公布号 JP2013246168(A) 申请公布日期 2013.12.09
申请号 JP20130107989 申请日期 2013.05.22
申请人 TEKTRONIX INC 发明人 DOBYNS KENNETH P;KRISTIE L VEITH
分类号 G01R13/20 主分类号 G01R13/20
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