A DEVICE FOR CONTROLLING EVENT SIGNAL OF MODULE UNIT TEST IN THE SEMICONDUCTOR TEST SYSTEMS

摘要

The present invention relates to a device for controlling the event signal of module unit test in semiconductor test systems. According to the present invention, the device for controlling the event signal of module unit test in semiconductor test systems includes test module (110); an event resistor (120); a main controller (130); and a sink part (140). [Reference numerals] (101) Tester Systrm Bus;(11) Test processor;(110) Test module (# 1);(130) Main controller;(140) Sink part (SYNC);(15) Error memory (FAM);(AA) Waveform generator (WFG);(BB) Pattern comparator (OC)