发明名称 IMAGE PROCESSING SYSTEM WITH ON-CHIP TEST MODE FOR COLUMN ADCs
摘要 An image processing system includes a pixel array including a plurality of regular pixel columns and at least one test pixel column, a plurality of column analog-to-digital converters (ADCs) configured to correspond to the regular pixel columns and convert analog input signals into digital signals, and a switching block configured to provide output signals of the regular pixel columns to input ends of the corresponding column ADCs in a normal mode, and provide in common an output signal of the test pixel column to the input ends of the column ADCs in a test mode, wherein the test pixel column generates signals having a minute voltage different from one row to another row.
申请公布号 KR101336848(B1) 申请公布日期 2013.12.06
申请号 KR20110109466 申请日期 2011.10.25
申请人 发明人
分类号 H04N5/357;H04N5/3745 主分类号 H04N5/357
代理机构 代理人
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