发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To suppress an area for consuming a material gas around a substrate support part of a boat; and improve uniformity in a film thickness on a substrate.SOLUTION: A semiconductor device manufacturing method comprises: a substrate mounting process of mounting on a substrate holding medium which exposes quarts or silicon carbide, a substrate which exposes a silicon surface and an insulation film surface; a carry-in process of carrying in the substrate holding medium on which the substrate is mounted into a processing chamber for processing the substrate; a selective growth step of selectively growing a silicon epitaxial film on the silicon surface of the substrate mounted on the substrate holding medium by concurrently or alternately supplying a silicon-containing gas and an etching gas to the processing chamber; and a carry-out process of carrying out the substrate from the processing chamber after the selective growth process.
申请公布号 JP2013243193(A) 申请公布日期 2013.12.05
申请号 JP20120114236 申请日期 2012.05.18
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 ISHIBASHI KIYOHISA;MORIYA ATSUSHI
分类号 H01L21/205;C23C16/04;C23C16/24;C23C16/458 主分类号 H01L21/205
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