发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To suppress an area for consuming a material gas around a substrate support part of a boat; and improve uniformity in a film thickness on a substrate.SOLUTION: A semiconductor device manufacturing method comprises: a substrate mounting process of mounting on a substrate holding medium which exposes quarts or silicon carbide, a substrate which exposes a silicon surface and an insulation film surface; a carry-in process of carrying in the substrate holding medium on which the substrate is mounted into a processing chamber for processing the substrate; a selective growth step of selectively growing a silicon epitaxial film on the silicon surface of the substrate mounted on the substrate holding medium by concurrently or alternately supplying a silicon-containing gas and an etching gas to the processing chamber; and a carry-out process of carrying out the substrate from the processing chamber after the selective growth process. |
申请公布号 |
JP2013243193(A) |
申请公布日期 |
2013.12.05 |
申请号 |
JP20120114236 |
申请日期 |
2012.05.18 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
ISHIBASHI KIYOHISA;MORIYA ATSUSHI |
分类号 |
H01L21/205;C23C16/04;C23C16/24;C23C16/458 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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