发明名称 METHODS FOR FABRICATING INTEGRATED CIRCUITS HAVING IMPROVED SPACERS
摘要 Methods for fabricating integrated circuits are provided. In an embodiment, a method for fabricating an integrated circuit includes providing a semiconductor substrate having a gate structure. An atomic layer deposition (ALD) process is performed to deposit a spacer around the gate structure. The ALD process includes alternating flowing ionized radicals of a first precursor across the semiconductor substrate and flowing a chlorosilane precursor across the semiconductor substrate to deposit the spacer.
申请公布号 US2013323923(A1) 申请公布日期 2013.12.05
申请号 US201213482871 申请日期 2012.05.29
申请人 KOEHLER FABIAN;MUTAS SERGEJ;TRIYOSO DINA;HUSSAIN ITASHAM;GLOBALFOUNDRIES INC. 发明人 KOEHLER FABIAN;MUTAS SERGEJ;TRIYOSO DINA;HUSSAIN ITASHAM
分类号 H01L21/283;H01L21/31 主分类号 H01L21/283
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