发明名称 METHOD AND SYSTEM FOR ULTRAFAST PHOTOELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a method which enables images with ultrafast (less than one picosecond) time resolution and atomic scale (nanometer order) spatial resolution to be generated using a transmission electron microscope.SOLUTION: A train of optical pulses output from a femtosecond laser 110 is guided along a path 134 into a chamber 130, and applied to a cathode 140. Electron pulses are emitted from the cathode because of the photoelectric effect, accelerated by an anode 142, collimated or focused by an electron lens 146, and applied to a specimen 150. Electrons transmitted through the specimen are focused by an electron lens 152 onto a detector 154. A signal detected by the detector is signal-processed by a processor, and information associated with a structure of the specimen is output.
申请公布号 JP2013243157(A) 申请公布日期 2013.12.05
申请号 JP20130162504 申请日期 2013.08.05
申请人 CALIFORNIA INST OF TECHNOLOGY 发明人 ZEWAIL AHMED;LOBASTOV VLADIMIR
分类号 H01J37/26;H01J37/073 主分类号 H01J37/26
代理机构 代理人
主权项
地址