发明名称 STRUCTURE FOR CREATING OHMIC CONTACT IN SEMICONDUCTOR DEVICES AND METHODS FOR MANUFACTURE
摘要 A semiconductor-to-metal interface with ohmic contact is provided. The interface includes a semiconductor material, a metal layer, and a silicon carbide layer disposed between the semiconductor material and the metal layer. The silicon carbide layer causes the formation of a semiconductor-to-metal interface with ohmic contact. Applications include forming a photovoltaic device with ohmic contact by disposing a layer of silicon carbide over the photovoltaic material before depositing a bottom electrode layer of metal to complete the bottom of a photovoltaic cell.
申请公布号 US2013320343(A1) 申请公布日期 2013.12.05
申请号 US201313844521 申请日期 2013.03.15
申请人 NUSOLA, INC. 发明人 YAMAGUCHI ATSUSHI;BRICENO JOSE
分类号 H01L31/0224;H01L31/20 主分类号 H01L31/0224
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