发明名称 Three Dimensional Integrated Circuit Structures and Hybrid Bonding Methods for Semiconductor Wafers
摘要 Three dimensional integrated circuit (3DIC) structures and hybrid bonding methods for semiconductor wafers are disclosed. A 3DIC structure includes a first semiconductor device having first conductive pads disposed within a first insulating material on a top surface thereof, the first conductive pads having a first recess on a top surface thereof. The 3DIC structure includes a second semiconductor device having second conductive pads disposed within a second insulating material on a top surface thereof coupled to the first semiconductor device, the second conductive pads having a second recess on a top surface thereof. A sealing layer is disposed between the first conductive pads and the second conductive pads in the first recess and the second recess. The sealing layer bonds the first conductive pads to the second conductive pads. The first insulating material is bonded to the second insulating material.
申请公布号 US2013320556(A1) 申请公布日期 2013.12.05
申请号 US201213488745 申请日期 2012.06.05
申请人 LIU PING-YIN;HUANG XIN-HUA;CHAO LAN-LIN;TSAI CHIA-SHIUNG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIU PING-YIN;HUANG XIN-HUA;CHAO LAN-LIN;TSAI CHIA-SHIUNG
分类号 H01L23/48;H01L21/762 主分类号 H01L23/48
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